Semiconductor/Solar Metrology Systems

Photovoltaic solar metrology system with push-pull probe

Photovoltaic/Solar Metrology System

A high-speed, multi-channel thickness, TTV and bow measurement module for in-process monitoring of solar/photovoltaic wafers and other materials.
Proforma 300iSA

Semi-automated Metrology System

The Proforma 300iSA is a benchtop/desktop, semi-automated wafer measurement system for semi-conducting and semi-insulating materials delivering full wafer surface scanning for thickness, thickness variation, bow, warp, sori, site and global flatness.
Proforma 300i Manual Semiconductor Metrology System

Manual Semiconductor Metrology System

The Proforma 300i wafer thickness gauge is a capacitance-based, differential measurement system that performs non-contact thickness measurements of semiconducting and semi-insulating wafers.

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