Contact MTI Sales 800-342-2203 | [email protected]
Contact MTI Sales 800-342-2203
[email protected]
High-Accuracy Capacitance Sensors
Made in the USA
MTI’s US-made capacitance sensor systems have set the standard for accuracy in non-contact measurement and reliability for over 50 years. MTI Instruments is a recognized leader in precision capacitive measurement, with products used across a range of industries and applications.
Capacitance Sensors and Transducers
MTI Instruments provides non-contact measurement systems and solutions for applications that require precise measurement. Examples of applications include position sensing, dynamic measurement, and thickness measurement. Some of our innovative capacitive-based sensor systems are below.
 | ACCUMEASURE | Digital Capacitance Sensor The Accumeasure D capacitance displacement sensor series amplifier converts a highly reliable capacitive electric field measurement (displacement) directly into a 24 bit digital reading to measure position, thickness, motion and vibration. |
 | ACCUMEASURE | Analog Accumeasure System 9000 is a high-resolution, capacitance-based instrument that provides the perfect solution to many previously unattainable measurement applications. |
 | ACCUMEASURE Board/MicroCap The Accumeasure MicroCap is a compact, custom designed, OEM capacitance board for high-precision non-contact displacement, thickness and gap measurement. |
 | ACCUMEASURE | Modular Capacitance Rack System The Accumeasure TM 500 compact multi channel capacitance rack system accepts up to 6 capacitance amplifiers.The modular design allows customers to populate the rack with their required number of measurement channels for thickness or single ended displacement measurements. |
 | Capacitance Probe MTI offers probes for grounded targets using single-ended probes and for ungrounded or poorly grounded targets using push/pull probes. |
 | Photovoltaic/Solar | Metrology System A high-speed, multi-channel thickness, TTV and bow measurement module for in-process monitoring of solar/photovoltaic wafers and other materials. |
 | Semiconductor Metrology System The Proforma 300i wafer thickness gage is a capacitance-based, differential measurement system that performs non-contact thickness measurements of semiconducting and semi-insulating wafers. |
 | Semi-automated Metrology System The Proforma 300SA is a benchtop/desktop, semi-automated wafer measurement system for semi-conducting and semi-insulating materials. Based on MTII’s exclusive Push-Pull capacitance technology, the Proforma 300SA delivers full wafer surface scanning for thickness, thickness variation, bow, warp, sori, site and global flatness. |
Get More Information
Get detailed specs about our capacitance sensor products.
[formidable id=7]
We custom-make measurement tools as well. Just ask MTI what we can do for you.
Get More Information
Get detailed specs about our capacitance sensor products.
[formidable id=7]
Capacitance Sensors and Transducers
MTI Instruments provides non-contact measurement systems and solutions for applications that require precise measurement. Examples of applications include position sensing, dynamic measurement, and thickness measurement. Some of our innovative capacitive-based sensor systems are below.
 | ACCUMEASURE | Digital Capacitance Sensor The Accumeasure D capacitance displacement sensor series amplifier converts a highly reliable capacitive electric field measurement (displacement) directly into a 24 bit digital reading to measure position, thickness, motion and vibration. |
 | ACCUMEASURE | Analog Accumeasure System 9000 is a high-resolution, capacitance-based instrument that provides the perfect solution to many previously unattainable measurement applications. |
 | ACCUMEASURE Board/MicroCap The Accumeasure MicroCap is a compact, custom designed, OEM capacitance board for high-precision non-contact displacement, thickness and gap measurement. |
 | ACCUMEASURE | Modular Capacitance Rack System The Accumeasure TM 500 compact multi channel capacitance rack system accepts up to 6 capacitance amplifiers.The modular design allows customers to populate the rack with their required number of measurement channels for thickness or single ended displacement measurements. |
 | Capacitance Probe MTI offers probes for grounded targets using single-ended probes and for ungrounded or poorly grounded targets using push/pull probes. |
 | Photovoltaic/Solar | Metrology System A high-speed, multi-channel thickness, TTV and bow measurement module for in-process monitoring of solar/photovoltaic wafers and other materials. |
 | Semiconductor Metrology System The Proforma 300i wafer thickness gage is a capacitance-based, differential measurement system that performs non-contact thickness measurements of semiconducting and semi-insulating wafers. |
 | Semi-automated Metrology System The Proforma 300SA is a benchtop/desktop, semi-automated wafer measurement system for semi-conducting and semi-insulating materials. Based on MTII’s exclusive Push-Pull capacitance technology, the Proforma 300SA delivers full wafer surface scanning for thickness, thickness variation, bow, warp, sori, site and global flatness. |
We custom-make measurement tools as well. Just ask MTI what we can do for you.
Copyright © 2020 MTI Instruments. All Rights Reserved | 800-342-2203 | [email protected]
Copyright © 2020 MTI Instruments. All Rights Reserved.
800-342-2203 |[email protected]
